Toshiba Releases Small Photorelay with High Speed Turn-On Time that Helps Shorten Test Time for Semiconductor Testers 2023/05/26 Toshiba
Measurement / Test
May 25, 2023
KAWASAKI, Japan—Toshiba Electronic Devices & Storage Corporation ("Toshiba") has launched "TLP3476S," a photorelay in the S-VSON4T package that cuts turn-on time to half that of Toshiba’s current product, TLP3475S. Volume shipments start today.
TLP3476S is faster and more compact than Toshiba's current TLP3475S. It realizes high efficiency optical coupling by improving the optical output of infrared LEDs and optimizing the design of photo detector devices (photodiode arrays). This improves operating speed and pushes turn-on time to a maximum of 0.25ms -- 50% faster. It is also 20% slimmer, due to a smaller, low profile S-VSON4T package that is 1.4mm at maximum. This helps to reduce the size of equipment that requires multiple boards.
TLP3476S is suitable for the pin electronics of semiconductor testers, which use a large number of relays that require a shorter switching time.
Applications
•Semiconductor testers (high-speed memory testers, high-speed logic testers, etc.)
•Probe cards
•Measurement equipment
Features
•Small S-VSON4T packages: 1.45mm × 2.0mm (typ.), t=1.4mm (max)
•High-speed turn-on time: tON=0.25ms (max)
Follow the link below for more on the new product.
*Company names, product names, and service names may be trademarks of their respective companies.
*Information in this document, including product prices and specifications, content of services and contact information, is current on the date of the announcement but is subject to change without prior notice.
Companies Website:
http://www.semicon.toshiba.co.jp/
Toshiba News Release
2024/11/13 Toshiba
Automotive
2024/11/01 Toshiba
Automotive
2024/10/28 Toshiba
Automotive
2024/09/26 Toshiba
Power Supply
2024/09/05 Toshiba
Automotive
Related News Release
2024/06/14
STMicroelectronics
Measurement / Test
2024/06/12
STMicroelectronics
Measurement / Test
2024/06/05
Recom
Measurement / Test
2024/05/31
STMicroelectronics
Measurement / Test
2023/12/06
STMicroelectronics
Measurement / Test